Real-time elemental analysis results on the job, no matter where the job takes place
Unparalleled speed and accuracy
Completely non-destructive analysis
Excellent software for data reporting and evaluation
Light element analysis (Mg, Al, Si, P, S) without helium of vacuum purge for ultimate portability
Large surface area SDDs (silicon drift detectors) come standard in all xSORT handheld instruments, assuring that you get the best value available in handheld XRF instrumentation